Atomic Force Microscopy

Atomic Force Microscopy

  • Nano System Pars Co.
  • Scanning probe microscope

    1. NanoScale Certification

    2. 2017/11/21
    3. 2020/11/21

    1. Certificate of Nanotechnology

    2. 2017/11/21
    3. 2020/11/21
Introduction Application Specification Advantage Of Using Nanotechnology Manual And Maintenance Safety And Package
Scanning probe microscopy (SPM) is a powerful and relatively new imaging technique which is able to reveal morphologies and local properties of various surfaces with high spatial resolution – nominally better than 0.1 nm. Like other scanning analysis methods, e.g. scanning electron microscopy, in the SPM technique the surface is first scanned; then the image will be generated by processing of the obtained signals from all scanned points of the surface. Both the resolution and the magnification of SPM are superior to common electron microscopy; besides, SPM allows taking 3-dimensional images from atoms. In addition to imaging capabilities, SPM is also capable of displacing atoms and able to study a wide spectrum of hard, soft, conductive, semi conductive, insulator, magnetic, and other materials. The SPM is generally known as the first choice for studying and imaging surface topography (bumps and depressions) and for revealing changes in physical and chemical properties of interested structures (molecular structures, for example) over examined area (from several hundreds of micrometers to few nanometer). The two most common type of SPM, are Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).
In AFM the basis of image formation lies on forces exist between the probe's tip and the surface. The AFM can use two imaging modes – contact and non-contact mode. In the AFM, the examined surface is touched and scanned by sharp tip 2-micrometer long with diameter below 100 Å. The tip is placed in the end of a 100~200µm-long cantilever made of springy materials. The other end of the cantilever is fixed to a piezoelectric actuator lever – a module which is responsible for displacing the probe in Z-direction in response to electrical signals received from computer-based software. When the probe scans a given sample, its surface asperities make the probe move upwards and downwards, result in some deflection and twisting in the cantilever. A detector, usually an array of photodiodes, records the cantilever movements; with the aid of computer-based module and sending the corrective signals to the piezoelectric actuator lever to adjust probe position, a map of surface asperities (bumps and depressions) will form.  
  • 3-dimensional imaging from surface topography including roughness, grain size, height of steps and unevenness.
  • Imaging from various surface features like magnetic field, capacitance, friction and phase.
  • Survey and manipulation of the surface in atomic scale.
  • Nanolithography and etching in nanoscale, displacing of atoms and molecules, and creating artificial structures.
NAMA-AFM is an advanced scanning force microscope capable of providing clear, accurate and reproducible 2D and 3D images in Nano meter-scale. The specifications of the Atomic Force Microscopy (NAMA AFM model) offered by the manufacturer have been presented in the Table.
 
Atomic force microscopy (AFM) is a unique tool for nanomaterial imaging, characterizing, and even manipulation. AFM can generate images at atomic resolution with angstrom scale (lateral and vertical resolution can be better than 0.1 nm). 
  • The apparatus must be installed on the hard surface, in a dry (not humidity) and clean environment.
  • Choose a separate and specific room for the installation of apparatus (preferably in basement beside pillars), it is strongly advised that never put other LAB instruments in that room.
  • Using antireflective acoustic coatings and carpet for the room floor is strongly advised (to reduce acoustic noises as well as eliminate dust and ash)
  • For more details on how to use the device, refer to the device catalog and user guide.
  • Use a proper electrical cable to connect the apparatus to a compatible AC adaptor, and then to connect the AC adaptor to the grounded wall plug outlet.
  • Providing a separate small, heavy and stable table for the mechanical module is mandatory. 
  • Never install or put the apparatus in a place exposed to direct sunlight ray or near heat source. 
  • The installing room of apparatus must have low humidity. Nevertheless, in regions with high humidity, use of humidity reducing systems is necessary.
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